JEL Robot ServiceMaxMile
1.reduce In-dot process and wafer-level LED optical and electrical properties measurement.
2. no destruction of EL and EL mapping measurement.
3. wafer size: 2"~ 8" wafer.
2. no destruction of EL and EL mapping measurement.
3. wafer size: 2"~ 8" wafer.
4. Wavelength range: UV/VIS or VIS/IR, or customized.
5. Current measurement range: standard > 10e-6A, optional>10e-12A.
6. Use camera for wafer
5. Current measurement range: standard > 10e-6A, optional>10e-12A.
6. Use camera for wafer