SE400 PV

  • BRAND: Sentech
  • DESCRIPTION: Measured the thickness, n index, k index of the different kinds of thin film with roughness surface
  • Nation of Principal:Germany
    Product Application
    Ellipsometer and Reflectometer can measure thickness, refractive index and extinction coefficient of any kind of thin film with roughness surface
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1. Ellipsometer and Reflectometer are non-destructive measuring instrument.
2. It can measure the thickness, n index of optical thin film with roughness surface
3. Provided high accuracy, stability and repeatibility measurement result.


  • MDPmap 1. Offline mapping less than 5 minute. 2. wafer classification based on lifetime data 3. lifetime..