DESCRIPTION： Measured the thickness, n index, k index of the different kinds of thin film with roughness surface
Nation of Principal：Germany
Product Application：Ellipsometer and Reflectometer can measure thickness, refractive index and extinction coefficient of any kind of thin film with roughness surface Related Link：http://www.sentech.de/
Keyword：Solar,Photovoltaics,metrology
1. Ellipsometer and Reflectometer are non-destructive measuring instrument.
2. It can measure the thickness, n index of optical thin film with roughness surface
3. Provided high accuracy, stability and repeatibility measurement result.
