SE800 PV

  • BRAND: Sentech
  • DESCRIPTION: Measured the thickness, n index, k index of the different kinds of thin film with roughness surface
  • Nation of Principal:Germany
    Product Application

    Ellipsometer and Reflectometer can measure thickness, refractive index and extinction coefficient of any kind of thin film with roughness surface
    Related Link

1. Spectral-scopic ellipsometer
2. Measure double AR layer  thickness, refractive index on textured wafer
3.Fast and very sensitive ellipsometric analysis on rough surfaces
4. Stabilized compensator for depolarization correction  
5. Step Scan Analyzer and polarizer tracking for accurate sample analysis  


  • MDPmap 1. Offline mapping less than 5 minute. 2. wafer classification based on lifetime data 3. lifetime..