Nation of Principal： Japan
Product Application： Non patterned Wafer Surface Inspection Related Link： http://www.pnp.co.jp/products_3_1e.html Keyword：Matching Hall effect meausrement of Si/SiC/GaN Epi thin film carrier desity/ mobility/ dopant thickness measurement
Tera Evaluator using new Thz ellisometer to measurement nontransparent think film thinkness. Non-Contact Epi-Si/Sic Surface Measurement for Carrier Density / Mobility / Dopant thickness
