DESCRIPTION： Integrate inspection equipment for automatic interpretation and use AOI/AI defect classification, effectively reducing operation work time on the production line.
Nation of Principal：Taiwan Product Application：Fast image defect auto judgement meant to save operator visual inspection time for various measurement tool e.g. SAT, X-ray, AOI Related Link：https://www.challentech.com.tw/
Integrate SMART VOS/AOI/AI technology with SAT detection equipment to achieve automatic SAT scanning and image analysis. It is suitable for SAT image analysis of Wafer/DIE Tray.
